Ion-implanted and bakeable silicon detectors
- 1 August 1981
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research
- Vol. 187 (2-3) , 595-598
- https://doi.org/10.1016/0029-554x(81)90394-3
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Measurement of ultra-thin windows of ion implanted silicon detectors with low energy proton beamsNuclear Instruments and Methods, 1976
- Semiconductor counters for nuclear radiations produced by ion implantationNuclear Instruments and Methods, 1974
- Dead Layers in Charged-Particle DetectorsIEEE Transactions on Nuclear Science, 1973
- Use of ion implantation techniques to fabricate semiconductor nuclear particle detectorsNuclear Instruments and Methods, 1968
- Semiconductor Counters with Thin Window n+ and p+ - Contacts Produced by Ion-ImplantationIEEE Transactions on Nuclear Science, 1968
- High resolution particle-detectors produced by ion-implantationNuclear Instruments and Methods, 1967
- Junction Counters Produced by Irradiation of Silicon with Dopant IonsIEEE Transactions on Nuclear Science, 1966
- The semiconductor surface barrier for nuclear particle detectionNuclear Instruments and Methods, 1961