Abstract
We have measured the absolute Raman scattering cross section of the terrace vibration mode of silicone-monohydride on a Si(111) surface that was prepared by chemical etching in a NH4F solution. The measured cross section at the incident wavelength of 4880 Å is (dσzzdΩ)=(8.37±0.32)×1028 cm2/(sr line Si-H bond). It is about 74 times the cross section of the symmetric stretching mode of the gaseous SiH4 molecule. The measured excitation profile of the cross section in the range of λin=45795145 Å has a ω4 dependence indicating that there is no resonant enhancement of the cross section. We estimate that the Raman transition dipole matrix elements are about three times larger for the Si(111)/H monolayer system than for the free SiH4 molecule.