Interface characterization of InSb MOS structures
- 1 March 1982
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 89 (4) , 401-406
- https://doi.org/10.1016/0040-6090(82)90320-0
Abstract
No abstract availableThis publication has 19 references indexed in Scilit:
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