Fabrication and AFM characterization of gold wires of less than 50 nm width buried in a SiO2substrate
- 1 January 1992
- journal article
- Published by IOP Publishing in Nanotechnology
- Vol. 3 (1) , 10-15
- https://doi.org/10.1088/0957-4484/3/1/003
Abstract
No abstract availableKeywords
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