Electron spin resonance characterization of self-trapped holes in amorphous silicon dioxide
- 1 October 1992
- journal article
- Published by Elsevier in Journal of Non-Crystalline Solids
- Vol. 149 (1-2) , 137-160
- https://doi.org/10.1016/0022-3093(92)90062-o
Abstract
No abstract availableKeywords
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