A quantitative approach to inner shell losses
- 1 January 1978
- journal article
- Published by Cambridge University Press (CUP) in Proceedings, annual meeting, Electron Microscopy Society of America
- Vol. 36 (1) , 526-527
- https://doi.org/10.1017/s042482010010977x
Abstract
Microanalysis by EELS has been developing rapidly and though the general form of the spectrum is now understood there is a need to put the technique on a more quantitative basis (1,2). Certain aspects important for microanalysis include: (i) accurate determination of the partial cross sections, σx(α,ΔE) for core excitation when scattering lies inside collection angle a and energy range ΔE above the edge, (ii) behavior of the background intensity due to excitation of less strongly bound electrons, necessary for extrapolation beneath the signal of interest, (iii) departures from the simple hydrogenic K-edge seen in L and M losses, effecting σx and complicating microanalysis. Such problems might be approached empirically but here we describe how computation can elucidate the spectrum shape.The inelastic cross section differential with respect to energy transfer E and momentum transfer q for electrons of energy E0 and velocity v can be written asThis publication has 6 references indexed in Scilit:
- Report of a workshop on analytical electron microscopy held at Cornell University, Ithaca, New York, USA, August 3–6, 1976Ultramicroscopy, 1977
- Contribution of electron energy loss spectroscopy to the development of analytical electron microscopyUltramicroscopy, 1976
- Electron energy loss spectrometry: Mean free paths for some characteristic X-ray excitationsPhilosophical Magazine, 1976
- Cross sections for ionization of inner-shell electrons by electronsReviews of Modern Physics, 1976
- Inelastic scattering of 80 keV electrons in amorphous carbonPhilosophical Magazine, 1975
- Inelastic Collisions of Fast Charged Particles with Atoms: Ionization of the AluminumShellPhysical Review A, 1972