Two-dimensional analytic modeling of very thin SOI MOSFETs
- 13 January 2003
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- A low-temperature NMOS technology with Cesium-implanted load devicesIEEE Transactions on Electron Devices, 1987
- Transconductance of Silicon-on-insulator (SOI) MOSFET'sIEEE Electron Device Letters, 1985