Examination of abraded MgO by X-Ray diffraction line broadening
- 1 September 1969
- journal article
- research article
- Published by Taylor & Francis in Philosophical Magazine
- Vol. 20 (165) , 489-494
- https://doi.org/10.1080/14786436908228721
Abstract
X-ray diffraction line broadening has been used to study the deformation of MgO during abrasion and the effect of annealing on the deformed structure. These results are compared with published data for filed metals and MgO which has been deformed by other means. The results are consistent with a uniform distribution of dislocations in the abraded MgO, and with a dislocation density of the order of 1011 cm−2. Recovery occurs in the temperature range 500–900°c, apparently by rearrangement of dislocations into lower energy configurations. No recrystallization occurred on heating to 1200°c.Keywords
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