Gallium Arsenide Transistors: Realization Through a Molecularly Designed Insulator
- 25 March 1994
- journal article
- other
- Published by American Association for the Advancement of Science (AAAS) in Science
- Vol. 263 (5154) , 1751-1753
- https://doi.org/10.1126/science.263.5154.1751
Abstract
A GaAs-based transistor, analogous to commercial silicon devices, has been fabricated with vapor-deposited cubic GaS as the insulator material. The n -channel, depletion mode, GaAs field-effect transistor shows, in addition to classical transistor characteristics, a channel mobility of 4665.6 square centimeters per volt per second, an interfacial trap density of 10 11 per electron volt per square centimeter, and a transconductance of 7 millisiemens for a 5-micrometer gate length at a gate voltage of 8 volts. Furthermore, the GaAs transistor shows an on-to-off resistance ratio comparable to that of commercial devices.Keywords
This publication has 15 references indexed in Scilit:
- Chemical vapor deposition of gallium sulfide: phase control by molecular designChemistry of Materials, 1993
- Enhancement of photoluminescence intensity of GaAs with cubic GaS chemical vapor deposited using a structurally designed single-source precursorApplied Physics Letters, 1993
- Chemical vapor deposition of cubic gallium sulfide thin films: a new metastable phaseChemistry of Materials, 1992
- Submicrometer n/sup +/-Ge gate AlGaAs/GaAs MISFETsIEEE Transactions on Electron Devices, 1989
- Si bipolar 2-GHz 6-bit flash A/D conversion LSIIEEE Journal of Solid-State Circuits, 1988
- Analysis of native oxide films and oxide-substrate reactions on III–V semiconductors using thermochemical phase diagramsThin Solid Films, 1983
- Schottky barriers: An effective work function modelApplied Physics Letters, 1981
- MBE-grown fluoride films: A new class of epitaxial dielectricsJournal of Vacuum Science and Technology, 1981
- New and unified model for Schottky barrier and III–V insulator interface states formationJournal of Vacuum Science and Technology, 1979
- The effect of surface states on the characteristics of MIS field effect transistorsSolid-State Electronics, 1978