Local Transport Property on Ferromagnetic Tunnel Junction Measured Using Conducting Atomic Force Microscope
- 1 July 1999
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 38 (7A) , L737
- https://doi.org/10.1143/jjap.38.l737
Abstract
The local topographical and electrical properties were measured simultaneously for a Ni80Fe20/Co/Al-oxide junction. Images with a lateral resolution of 1 nm and a current sensitivity of 3 pA were successfully obtained; no strong correlation between them was observed. From the results of local current-voltage characteristics also measured, it was clarified that the contrast of the current image indicated the distribution of barrier heights. The histogram of current density calculated by taking into consideration a Gaussian distribution corresponded qualitatively to the experimental result.Keywords
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