A high-resolution electrostatic spectrometer for the investigation of near-surface layers in solids by high-resolution Rutherford backscattering with MeV ions
- 1 February 1992
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 64 (1-4) , 817-824
- https://doi.org/10.1016/0168-583x(92)95585-f
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
- High-resolution electron microscopy studies of Nb/Al2O3 interfacesUltramicroscopy, 1990
- Design of a magnetic spectrograph for surface, interface and thin-layer analysisNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1990
- Optimization and application of glancing angle Rutherford backscattering spectrometryNuclear Instruments and Methods in Physics Research, 1983
- Angle resolved detection of charged particles with a novel type toroidal electrostatic analyserNuclear Instruments and Methods in Physics Research, 1982
- Position-sensitve semiconductor detectorsNuclear Instruments and Methods, 1979
- Calculation of energy straggling for protons and helium ionsPhysical Review A, 1976
- Surface analysis by charged particle spectroscopyNuclear Instruments and Methods, 1959
- Phänomenologische Theorie der Kristallabscheidung an Oberflächen. IZeitschrift für Kristallographie, 1958