The study of grain boundary thickness using electron diffraction techniques
- 1 April 1980
- journal article
- Published by Taylor & Francis in Philosophical Magazine A
- Vol. 41 (4) , 467-475
- https://doi.org/10.1080/01418618008239326
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- The measurement of grain boundary thickness using X–ray diffraction techniquesPhilosophical Magazine A, 1979
- Diffraction effects and images from inclined grain boundaries in polycrystalline thin foilsPhilosophical Magazine A, 1979
- On the analysis of electron diffraction patterns from twist grain boundariesPhilosophical Magazine, 1976
- The detection of the periodic structure of high-angle twist boundariesPhilosophical Magazine, 1975
- Grain-boundary diffusion and boundary widths in metals and ceramicsJournal of Applied Physics, 1974
- Diffraction from periodic arrays of dislocationsPhilosophical Magazine, 1973
- Diffraction from periodic arrays of dislocationsPhilosophical Magazine, 1973