Evidence of the Surface Origin of theNoise
- 31 October 1966
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 17 (18) , 956-958
- https://doi.org/10.1103/physrevlett.17.956
Abstract
DOI: https://doi.org/10.1103/PhysRevLett.17.956Keywords
This publication has 2 references indexed in Scilit:
- Characteristics of the metal-Oxide-semiconductor transistorsIEEE Transactions on Electron Devices, 1964
- An investigation of surface states at a silicon/silicon oxide interface employing metal-oxide-silicon diodesSolid-State Electronics, 1962