Layout and test design of synchronous LSI circuits

Publisher Website

1 January 1979

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/isscc.1979.1155969

Abstract

No abstract available

Keywords

This publication has 2 references indexed in Scilit:

Automated database-driven digital testing
Computer, 1974
Enhancing Testability of Large-Scale Integrated Circuits via Test Points and Additional Logic
IEEE Transactions on Computers, 1973