Multi-sampling method in an EBT for logic waveform measurement
- 31 May 1990
- journal article
- Published by Elsevier in Microelectronic Engineering
- Vol. 12 (1-4) , 417-424
- https://doi.org/10.1016/0167-9317(90)90055-x
Abstract
No abstract availableKeywords
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- A high speed signal averager for electron beam test systemsMicroelectronic Engineering, 1987
- E-beam testing of high-speed electronic devicesMicroelectronic Engineering, 1986
- Stroboscopic scanning electron microscopyJournal of Physics E: Scientific Instruments, 1968