Fivefold multiply twinned crystallites in CuInSe2

Abstract
The microstructure of polycrystalline CuInSe2 thin films are studied by cross‐sectional high resolution electron microscopy. The CuInSe2 films were deposited on a Mo coated glass substrate by three‐source evaporation. The film contained fivefold multiply twinned crystallites as well as a high density of twins in {112} planes. The formation of these defects are discussed.