Silicon nitride membrane substrates for the investigation of local structure in polymer thin films
- 1 June 1998
- Vol. 39 (16) , 3871-3875
- https://doi.org/10.1016/s0032-3861(97)10218-x
Abstract
No abstract availableKeywords
This publication has 14 references indexed in Scilit:
- Thickness-induced morphology changes in lamellar diblock copolymer ultrathin filmsEurophysics Letters, 1997
- Observed Surface Energy Effects in Confined Diblock CopolymersPhysical Review Letters, 1996
- Time evolution of the free surface of ultrathin copolymer filmsMacromolecules, 1993
- Improved technique for cross-sectional imaging of thin polymer films by transmission electron microscopyPolymer, 1993
- Ordering of thin diblock copolymer filmsPhysical Review Letters, 1992
- Atmospheric scanning electron microscopy using silicon nitride thin film windowsJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1991
- Surface-induced orientation of symmetric, diblock copolymers: a secondary ion mass-spectrometry studyMacromolecules, 1989
- Defect Interactions and Noise in Metallic NanoconstrictionsPhysical Review Letters, 1988
- The effect of surface constraints on the ordering of block copolymer domainsJournal of Materials Science, 1988
- Selective electron beam etching of multicomponent polymer systemsPolymer, 1978