Improved technique for cross-sectional imaging of thin polymer films by transmission electron microscopy
- 1 January 1993
- Vol. 34 (11) , 2427-2430
- https://doi.org/10.1016/0032-3861(93)90832-u
Abstract
No abstract availableKeywords
This publication has 22 references indexed in Scilit:
- Ordered morphologies in binary blends of diblock copolymer and homopolymer and characterization of their intermaterial dividing surfacesThe Journal of Chemical Physics, 1991
- Equilibrium surface composition of diblock copolymersThe Journal of Chemical Physics, 1990
- Investigation of diffusion in polystyrene using secondary ion mass spectroscopyMacromolecules, 1989
- A new class of positive electron beam resists: methyl methacrylate-styrene and butyl methacrylate-styrene comb copolymersPolymer, 1988
- Case-II diffusion in polymers. II. Steady-state front motionJournal of Applied Physics, 1987
- Morphology of block polymers near a free surfaceMacromolecules, 1985
- Analysis of diffusion in polymers by forward recoil spectrometryApplied Physics Letters, 1984
- Polyetherimides via nitro‐displacement polymerization: Monomer synthesis and 13C‐NMR analysis of monomers and polymersJournal of Polymer Science: Polymer Chemistry Edition, 1981
- Domain-Boundary Structure of Styrene-Isoprene Block Copolymer Films Cast from Solution. 4. Molecular-Weight Dependence of Lamellar MicrodomainsMacromolecules, 1980
- Surface Studies on Multicomponent Polymer Systems by X-ray Photoelectron Spectroscopy. Polystyrene/Poly(ethylene oxide) Diblock CopolymersMacromolecules, 1979