Diffused resistor mismatch modeling and characterization

Publisher Website

20 January 2003

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/bipol.1999.803518

Abstract

No abstract available

Keywords

This publication has 4 references indexed in Scilit:

A versatile structure for on-chip extraction of resistance matching properties
IEEE Transactions on Semiconductor Manufacturing, 1996
Matching properties of MOS transistors
IEEE Journal of Solid-State Circuits, 1989
Random error effects in matched MOS capacitors and current sources
IEEE Journal of Solid-State Circuits, 1984
Random errors in MOS capacitors
IEEE Journal of Solid-State Circuits, 1982