Transmission electron microscopy investigation of the effect of deposition conditions and a platinum layer in gas-sensitive r.f.-sputtered SnO2 films
- 1 November 2003
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 445 (1) , 38-47
- https://doi.org/10.1016/j.tsf.2003.08.056
Abstract
No abstract availableKeywords
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