Theoretical simulation of noncontact AFM images of Si(111) √3×√3-Ag surface based on Fourier expansion method
- 1 April 2000
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 157 (4) , 367-372
- https://doi.org/10.1016/s0169-4332(99)00552-8
Abstract
No abstract availableFunding Information
- Ministry of Education, Culture, Sports, Science and Technology
This publication has 12 references indexed in Scilit:
- Non-contact AFM images measured on Si(111)√3×√3-Ag and Ag(111) surfacesSurface and Interface Analysis, 1999
- Theory for the effect of the tip–surface interaction potential on atomic resolution in forced vibration system of noncontact AFMApplied Surface Science, 1999
- Distance dependence of noncontact-AFM image contrast on Si(111) × –Ag structureApplied Surface Science, 1999
- New Method for Noncontact Atomic Force Microscopy Image SimulationsJapanese Journal of Applied Physics, 1999
- The Relation between Resonance Curves and Tip-Surface Interaction Potential in Noncontact Atomic-Force MicroscopyJapanese Journal of Applied Physics, 1998
- Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force MicroscopyScience, 1995
- Efficient pseudopotentials for plane-wave calculationsPhysical Review B, 1991
- Pseudopotentials that work: From H to PuPhysical Review B, 1982
- Inhomogeneous Electron GasPhysical Review B, 1964
- On the Interaction of Electrons in MetalsPhysical Review B, 1934