New contactless method for lifetime measurement in semiconductor wafers
- 1 October 1983
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 54 (10) , 1386-1391
- https://doi.org/10.1063/1.1137251
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- New principle of contactless lifetime determination in semiconductor wafersReview of Scientific Instruments, 1981
- Spot illumination of a semiconductor panelProceedings of the IEEE, 1968
- Measurement of lifetimes in photoconductors by means of optical beatingInfrared Physics, 1966
- Theory of the Photomagnetoelectric Effect in SemiconductorsPhysical Review B, 1956
- Measurement of Minority Carrier Lifetime in GermaniumProceedings of the IRE, 1952