Characterization of layered synthetic microstructures using transmission electron microscopy
- 1 August 1985
- journal article
- Published by Optica Publishing Group in Journal of the Optical Society of America A
- Vol. 2 (8) , 1356-1362
- https://doi.org/10.1364/josaa.2.001356
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 10 references indexed in Scilit:
- Noncrystalline semiconductorsPhysics Today, 1984
- Characterization of layered synthetic microstructure by transmission electron microscopy and diffractionOptics Letters, 1984
- Fabry-Perot etalons for x-rays: Construction and characterizationOptics Communications, 1984
- The renaissance of x-ray opticsPhysics Today, 1984
- Solid Fabry-Perot etalons for X-raysOptics Communications, 1983
- Multilayers observed by transmission electron microscopyThin Solid Films, 1983
- Layered synthetic microstructures as Bragg diffractors for X rays and extreme ultraviolet: theory and predicted performanceApplied Optics, 1981
- Sputtered Layered Synthetic Microstruture (LSM) Dispersion ElementsAIP Conference Proceedings, 1981
- New Class of Layered MaterialsPhysical Review Letters, 1980
- THE FABRICATION OF MULTILAYER X-RAY MIRRORSAnnals of the New York Academy of Sciences, 1980