SOME APPLICATIONS OF ION-ELECTRON IMAGE CONVERSION IN FIELD ION MICROSCOPE STUDIES OF SURFACE REACTIONS
- 15 April 1971
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 18 (8) , 341-344
- https://doi.org/10.1063/1.1653689
Abstract
An ion‐electron image converter has been applied to field ion studies of surface reactions. Argon imaging has been used to study oxygen and carbon monoxide adsorption on tungsten while the effect of using the reactive imaging gases, oxygen, nitrogen, and carbon monoxide, has also been investigated. The reaction of nitrogen is of particular interest in the context of field‐induced rearrangement processes.Keywords
This publication has 7 references indexed in Scilit:
- FIELD-INDUCED SURFACE REARRANGEMENT IN A FIELD-ION MICROSCOPEApplied Physics Letters, 1970
- CHANNEL PLATE IMAGE CONVERTER IN ARGON FIELD-ION MICROSCOPYApplied Physics Letters, 1969
- Use of a channelled image intensifier in the field-ion microscopeJournal of Physics E: Scientific Instruments, 1969
- “Molecular Clusters” on the Surface of an Oxidizing MetalNature, 1968
- Thermal rearrangement of tungsten field emitters in the presence of adsorbed oxygenTransactions of the Faraday Society, 1968
- Chemisorption and surface corrosion in the tungsten + carbon monoxide system, as studied by field emission and field ion microscopyDiscussions of the Faraday Society, 1966
- Corrosion of Tungsten and Iridium by Field Desorption of Nitrogen and Carbon MonoxideThe Journal of Chemical Physics, 1963