C60 encapsulation of the Si(111)-(7×7) surface
- 28 December 1992
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 61 (26) , 3127-3129
- https://doi.org/10.1063/1.107982
Abstract
The structure of a Si(111)‐(7×7) surface capped by a 200 Å film of C60 was studied by grazing‐incidence x‐ray diffraction. The Si(111)‐(7×7) reconstruction prepared in vacuum, including the loosely bonded ‘‘adatoms’’ on the surface, is preserved under the C60 overlayer. This result illustrates that C60 can be used as an inert cap for surfaces and suggests potentially interesting applications in surface science research and electronic device engineering.Keywords
This publication has 9 references indexed in Scilit:
- X-ray scattering study of Ag/Si(111) buried interface structuresPhysical Review Letters, 1992
- Solid C60Physics Today, 1991
- Compressibility of Solid C 60Science, 1991
- Solid C60: a new form of carbonNature, 1990
- Observation of strain in the Si(111) 7×7 surfacePhysical Review B, 1988
- Ordering atand Si(111)/SiInterfacesPhysical Review Letters, 1986
- X-ray diffraction evidence of adatoms in the Si(111)7×7 reconstructed surfacePhysical Review B, 1986
- Structure analysis of Si(111)-7 × 7 reconstructed surface by transmission electron diffractionSurface Science, 1985
- A Fourier Series Method for the Determination of the Components of Interatomic Distances in CrystalsPhysical Review B, 1934