X-ray scattering study of Ag/Si(111) buried interface structures
- 27 January 1992
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 68 (4) , 507-510
- https://doi.org/10.1103/physrevlett.68.507
Abstract
Various interface structures formed between Si(111) and a thick Ag overlayer are investigated by grazing-incidence x-ray diffraction. The (7×7) reconstruction of Si(111) is preserved under a room-temperature deposited Ag film. Upon annealing to 250 °C the interface becomes (1×1). This is contrasted by the (√3 × √3 )R30° structure formed by annealing a thin Ag film on Si(111). By depositing a thick Ag film on this (√3 × √3 )R30° Ag/Si(111) surface at room temperature, the (√3 × √3 )R30° reconstruction is suppressed.Keywords
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