Spatial resolution of thermal wave microscopes
- 1 September 1983
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 43 (5) , 446-448
- https://doi.org/10.1063/1.94383
Abstract
It is demonstrated theoretically and confirmed experimentally that the intrinsic spatial resolution of a thermal wave microscope in the extreme near field limit is independent of thermal wavelength and is determined by the depth of the thermal scatterer beneath the surface of the specimen.Keywords
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