The preparation of small, particulate specimens by critical point drying: application for scanning electron microscopy
- 1 May 1974
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 101 (1) , 77-80
- https://doi.org/10.1111/j.1365-2818.1974.tb03868.x
Abstract
No abstract availableKeywords
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