Classes of Diagnostic Tests
- 1 January 1983
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- No. 0738100X,p. 316-322
- https://doi.org/10.1109/dac.1983.1585668
Abstract
This paper presents the results of an investigation into the types of tests useful for automatically diagnosing combinational digital devices. The diagnosis is based on a design model that allows hierarchy in both the structure and the data of the device being represented. A more general set of assumptions than is commonly employed allows data values other than boolean values to be diagnosed, and permits faults other than stuck-at faults to be found. The design model, the assumptions, and the tests are represented in SUBTLE, a language based on predicate calculus and specialized for digital systems.Keywords
This publication has 3 references indexed in Scilit:
- Fault Diagnosis in Synchronous Sequential Circuits Based on an Effect–Cause AnalysisIEEE Transactions on Computers, 1982
- A Hierarchical, Path-Oriented Approach to Fault Diagnosis in Modular Combinational CircuitsIEEE Transactions on Computers, 1982
- Diagnosis & Reliable Design of Digital SystemsPublished by Springer Nature ,1976