Residual stresses of thin, short rectangular plates
- 1 December 1985
- journal article
- Published by Springer Nature in Journal of Materials Science
- Vol. 20 (12) , 4459-4464
- https://doi.org/10.1007/bf00559335
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Non-destructive determination of residual stresses in circular silicon wafersMechanics Research Communications, 1984
- Nondestructive residual-stress measurement in a wide-flanged rolled beam by acoustoelasticityExperimental Mechanics, 1983
- “PARS”—A Portable X-Ray Analyzer for Residual StressesJournal of Testing and Evaluation, 1978