Silicon lattice measurement with an improved X-ray/optical interferometer
- 1 April 1993
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement
- Vol. 42 (2) , 401-404
- https://doi.org/10.1109/19.278590
Abstract
No abstract availableThis publication has 13 references indexed in Scilit:
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