High-aspect-ratio, ultrathick, negative-tone near-uv photoresist for MEMS applications
- 22 November 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Sub-micron LIGA process for movable microstructuresMicroelectronic Engineering, 1996
- Micromachining applications of a high resolution ultrathick photoresistJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1995
- High-aspect-ratio resist for thick-film applicationsPublished by SPIE-Intl Soc Optical Eng ,1995
- Fabrication of microstructures with high aspect ratios and great structural heights by synchrotron radiation lithography, galvanoforming, and plastic moulding (LIGA process)Microelectronic Engineering, 1986