Survey of Noise of Hot Carriers: Some Experimental and Theoretical Aspects
- 1 January 1978
- book chapter
- Published by Springer Nature
Abstract
No abstract availableKeywords
This publication has 19 references indexed in Scilit:
- Low noise “ohmic” contacts on n-type siliconSolid-State Electronics, 1977
- Hot-electron diffusion noise in n-silicon using a radiometric method in the X-band regionApplied Physics Letters, 1977
- Pulsed technique for noise temperature measurementJournal of Physics E: Scientific Instruments, 1974
- Mobility, Noise Temperature, and Diffusivity of Hot Holes in GermaniumPhysical Review B, 1973
- Metal semiconductor contact: Resistivity and noiseSolid-State Electronics, 1973
- Anisotropy in diffusion-noise temperature and differential mobility induced in semiconductors by an external electric fieldPhysica, 1973
- Noise Temperature and the Spectral Density of Hot Carrier Velocity Flutuations in SemiconductorsPhysica Status Solidi (b), 1973
- High-field current fluctuations in n-type germaniumCanadian Journal of Physics, 1970
- Transport Properties of GaAsPhysical Review B, 1968
- Noise Temperature of Hot Electrons in GermaniumPhysical Review Letters, 1962