EXAFS study of passive films on Ni and Ni-Mo alloy electrodes
- 1 July 1988
- journal article
- Published by Wiley in Surface and Interface Analysis
- Vol. 12 (7) , 380-384
- https://doi.org/10.1002/sia.740120703
Abstract
The specular reflectivity of x‐rays at sufficiently small grazing angles is absorption‐coefficient‐dependent so that the EXAFS technique can be used to probe the surface. This method allows in situ measurements. Applications to the study of passive films on nickel and nickel‐molybdenum alloy electrodes are presented. In both cases, the passive films is found to be composed of NiO entities probably ordered perpendicularly to the electrode. Molybdenum enrichment in the surface layer is confirmed by an increase of the Mo k edge signal.Keywords
This publication has 10 references indexed in Scilit:
- Plenary Lecture—1986:Effects of Alloy Composition and Microstructure on the Passivity of Stainless SteelsCorrosion, 1986
- On the Conduction Mechanisms of Passive Films on Molybdenum-Containing Stainless SteelCorrosion, 1986
- Exafs from measurements of X-ray reflectivity on passivated electrodesJournal of Electroanalytical Chemistry and Interfacial Electrochemistry, 1984
- Investigation of the Anodically Formed Passive Film on Iron by Secondary Ion Mass SpectroscopyJournal of the Electrochemical Society, 1984
- Surface Segregation of Molybdenum during Pitting Corrosion of a Nickel-Molybdenum AlloyCorrosion, 1984
- Development of a new energy scanned (4–20 keV) ESAFS-II spectrometer at lureNuclear Instruments and Methods in Physics Research, 1983
- EXAFS AS A PROBE OF THE PASSIVE FILM STRUCTUREPublished by Elsevier ,1983
- On experimental attenuation factors of the amplitude of the EXAFS oscillations in absorption, reflectivity and luminescence measurementsJournal de Physique, 1982
- EXAFS studies on superficial regions by means of total reflectionPhysica Status Solidi (a), 1980
- Ab initio calculations of amplitude and phase functions for extended x-ray absorption fine structure spectroscopyJournal of the American Chemical Society, 1979