Electrical noise measurements on magnetic films (invited)

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Abstract
The magnetic structure and dynamics of thin films, especially antiferromagnets and spin glasses, are notoriously difficult to study due to the small volumes of materials involved. Electrical resistivity turns out to be sensitive to small fluctuations in magnetic configurations, allowing measurements of magnetic dynamics in films. Since measurements can be made in extremely small samples, the properties of individual fluctuating units, such as antiferromagnetic domains, can be studied directly. We discuss results in the antiferromagnet Cr and the spin glass CuMn.