Weak-beam contrast of stacking faults in transmission electron microscopy
- 16 April 1980
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 58 (2) , 393-407
- https://doi.org/10.1002/pssa.2210580210
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
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- Crystallographic defects in epitaxial silicon filmsThin Solid Films, 1976
- Applications of many beam systematic diffraction contrast in high voltage transmission electron microscopyPhysica Status Solidi (a), 1974
- Crystal Defects and Crystalline InterfacesPublished by Springer Nature ,1970
- Investigations of dislocation strain fields using weak beamsPhilosophical Magazine, 1969