Electronic structure of deep-bonded substitutional impurities in silicon
- 15 November 1982
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 26 (10) , 5706-5715
- https://doi.org/10.1103/physrevb.26.5706
Abstract
The recently-developed Green's-function method for defects in semiconductors is used to investigate the electronic properties of deep substitutional -bonded impurities in Si. These impurities are grouped according to the value where is the chemical valence. We choose a typical representative impurity from each group: sulfur with (double donor), zinc with (double acceptor), and hydrogen with (triple acceptor). In each case we obtain the impurity-induced state-density changes in the valence bands, and the energy positions and wave functions of the bound states in the forbidden gaps. These results are compared with earlier results for the vacancy, which may be viewed as a nominal quadruple acceptor. We describe a simple physical model which explains the chemical trends as a function of and compare with available experimental data.
Keywords
This publication has 15 references indexed in Scilit:
- The electronic structure of deep SP-bonded acceptor impurities in semiconductorsSolid State Communications, 1981
- Jahn-Teller-Distorted Nitrogen Donor in Laser-Annealed SiliconPhysical Review Letters, 1980
- Scattering-theoretic method for defects in semiconductors. II. Self-consistent formulation and application to the vacancy in siliconPhysical Review B, 1980
- The effective-mass nature of deep-level point-defect states in semiconductorsSolid State Communications, 1980
- Theory of Substitutional Deep Traps in Covalent SemiconductorsPhysical Review Letters, 1980
- New self-consistent approach to the electronic structure of localized defects in solidsPhysical Review B, 1979
- Hydrogen on Pd(111): Self-Consistent Electronic Structure, Chemical Bonding, and Photoemission SpectraPhysical Review Letters, 1979
- The electronic structure of impurities and other point defects in semiconductorsReviews of Modern Physics, 1978
- Self-Consistent Method for Point Defects in Semiconductors: Application to the Vacancy in SiliconPhysical Review Letters, 1978
- Self-Consistent Green's-Function Calculation of the Ideal Si VacancyPhysical Review Letters, 1978