Electron Extinction Distance in Silicon
- 1 January 1964
- journal article
- conference paper
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 35 (1) , 217-219
- https://doi.org/10.1063/1.1713073
Abstract
A method is described for the measurement of the extinction distance for electrons transmitted through crystals. Results for Si are in excellent agreement with dynamical diffraction theory if relativistic corrections are taken into account.This publication has 7 references indexed in Scilit:
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