Measurement of the silicon (220) lattice spacing
- 16 May 1994
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 72 (20) , 3133-3136
- https://doi.org/10.1103/physrevlett.72.3133
Abstract
The (220) lattice spacing of a silicon crystal was measured by combined x-ray and optical interferometry to about 3× relative accuracy. The value obtained is =192015.551±0.005) fm. After correcting for the impurity-induced lattice contraction, =192015.569±0.006 fm is obtained
Keywords
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