On the decline of testing efficiency as fault coverage approaches 100%
- 19 November 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 14 references indexed in Scilit:
- THE EFFECT OF DIFFERENT TEST SETS ON QUALITY LEVEL PREDICTION: WHEN IS 80% BETTER THAN 90%?Published by Institute of Electrical and Electronics Engineers (IEEE) ,2005
- I/sub DDQ/ TESTING IN CMOS DIGITAL ASIC'S - PUTTING IT ALL TOGETHERPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2005
- Detecting bridging faults with stuck-at test setsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Limitations in predicting defect level based on stuck-at fault coveragePublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- The influences of fault type and topology on fault model performance and the implications to test and testable designPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Enhanced testing performance via unbiased test setsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- I DDQ testing as a component of a test suite: The need for several fault coverage metricsJournal of Electronic Testing, 1992
- Characterizing the LSI Yield Equation from Wafer Test DataIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1984
- On the distribution of the number of unobserved elements when m-samples of size n are drawn from a finite populationCommunications in Statistics - Theory and Methods, 1981
- Bridging and Stuck-At FaultsIEEE Transactions on Computers, 1974