Time-of-Flight Effects in Quadrupole-Based Scanning Ion Microprobes
- 1 January 1980
- Vol. 3 (2) , 133-138
- https://doi.org/10.1002/sca.4950030209
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Production of molecular noble gas ions in a hot cathode ion sourceJournal of Vacuum Science and Technology, 1979
- Raster scanning depth profiling of layer structuresApplied Physics A, 1977
- Successful operation of a scanning ion microscope with quadrupole mass filterReview of Scientific Instruments, 1976
- Ion Microprobe Mass AnalyzerJournal of Applied Physics, 1967