Characteristic X-ray production by heavy ion bombardment as a technique for the examination of solid surfaces
- 1 February 1973
- journal article
- Published by Elsevier in Surface Science
- Vol. 34 (3) , 638-648
- https://doi.org/10.1016/0039-6028(73)90031-9
Abstract
No abstract availableKeywords
This publication has 16 references indexed in Scilit:
- Measurements of the critical angle for channeling of heavy ions in copper using characteristic X-ray generationRadiation Effects, 1972
- A proportional counter window filter for the preferential detection of boron-K X raysNuclear Instruments and Methods, 1971
- Cross sections for Ar L-shell x-ray emission in collisions of He+, C+, N+, O+, Al+, Cl+, Ti+, Fe+, Cu+ on ArPhysica, 1971
- Selective X-ray generation by heavy ions (Part 2) measurement of the concentration distribution of ion-implanted antimony in silicon by the use of selective heavy ion X-ray excitationRadiation Effects, 1971
- Selective X-ray generation by heavy ions (Part 1) the use of energetic heavy ions to generate characteristic X-rays from elements in a selective mannerRadiation Effects, 1971
- Auger spectroscopy of titaniumSurface Science, 1971
- LEED and Auger investigations of Cu (111) surfaceSurface Science, 1971
- X-Ray Production in Ion-Atom Collisions: The Influence of Level MatchingPhysical Review Letters, 1970
- A new end-window variable geometry x-ray proportional counterNuclear Instruments and Methods, 1970
- Collection and sputtering experiments with noble gas ionsNuclear Instruments and Methods, 1961