Atomic force microscope investigation of C60 adsorbed on silicon and mica

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Abstract
The morphological and frictional characteristics of C60 adsorbed on silicon and mica surfaces have been investigated using atomic force microscopy (AFM). Deposition of fullerenes by vacuum sublimation results in uniform coverage of microcrystallites with an average size between 40 and 60 nm. Small area scans on the top of these microcrystallites show disordered arrangements of molecules. Frictional measurements carried out monitoring buckling of the AFM cantilever show increased friction for C60‐covered surfaces over that of clean substrates. At sufficiently high forces, the film was selectively displaced by the AFM tip, so that fine patterns could be drawn on fullerene‐covered surfaces.