Structure of Alumina Grain Boundaries Prepared with and without a Thin Amorphous Intergranular Film
- 1 August 1990
- journal article
- Published by Wiley in Journal of the American Ceramic Society
- Vol. 73 (8) , 2485-2493
- https://doi.org/10.1111/j.1151-2916.1990.tb07616.x
Abstract
The presence of a thin amorphous intergranular film along grain boundaries in alumina is expected to affect the properties of the interface and hence those of the material. In the present study, two types of grain boundaries have been formed in hot‐pressed alumina bicrystals. In one case, the surfaces of the sintered crystals were kept as clean as possible, while in the other a thin layer of SiO2 was intentionally deposited onto the surface of one crystal. The distribution of SiO2 along the resulting grain boundary was then monitored by transmission electron microscopy and compared with the morphological features of the interface. In the special cases chosen here, the glass receded into large pores which grew into the alumina itself. However, the presence of the glassy phase during the early stages of sintering clearly did influence the characteristics of the resulting grain boundaries.Keywords
This publication has 30 references indexed in Scilit:
- gS = 99 and Σ = 41 Grain boundariesActa Metallurgica, 1988
- Orientation Dependence of Grain-Boundary Critical Currents inBicrystalsPhysical Review Letters, 1988
- The identification of thin amorphous films at grain-boundaries in Al2O3Journal of Materials Science, 1986
- The Structure of Surface Steps on Low-Index Planes of Oxides.MRS Proceedings, 1985
- On the detection of thin intergranular films by electron microscopyUltramicroscopy, 1979
- Observations on the grain-boundary of Al2O3 bicrystalsCeramurgia International, 1979
- Electrolysis of Sodium through Alumina Arc TubesJournal of the Illuminating Engineering Society, 1979
- Physical properties of the electrical barriers in varistorsJournal of Vacuum Science and Technology, 1976
- Bollmann's 0-Iattice theory; a geometrical approach to interface structureInternational Materials Reviews, 1976
- Crystal Defects and Crystalline InterfacesPublished by Springer Nature ,1970