Fault simulation for delay faults
- 7 January 2003
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Random pattern testability of delay faultsIEEE Transactions on Computers, 1988
- Critical Path Tracing - An Alternative to Fault SimulationPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1983
- An Implicit Enumeration Algorithm to Generate Tests for Combinational Logic CircuitsIEEE Transactions on Computers, 1981
- An Experimental Delay Test Generator for LSI LogicIEEE Transactions on Computers, 1980
- Concurrent simulation of nearly identical digital networksComputer, 1974
- Diagnosis of Automata Failures: A Calculus and a MethodIBM Journal of Research and Development, 1966
- On an Improved Diagnosis ProgramIEEE Transactions on Electronic Computers, 1965