Does The Esd-failure Current Obtained By Transmissionline Pulsing Always Correlate To Human Body Model Tests?

Publisher Website

1 January 1997

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

p. 366-372
https://doi.org/10.1109/eosesd.1997.634264

Abstract

No abstract available

Keywords

This publication has 2 references indexed in Scilit:

Risetime effects of HBM and square pulses on the failure thresholds of GGNMOS-transistors
Microelectronics Reliability, 1996
ESD in integrated circuits
Quality and Reliability Engineering International, 1992