New approaches to quantitative x-ray microanalysis of thin films and surfaces
- 1 January 1983
- journal article
- Published by Elsevier in Spectrochimica Acta Part B: Atomic Spectroscopy
- Vol. 38 (11-12) , 1411-1419
- https://doi.org/10.1016/0584-8547(83)80004-4
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Quantitative electron probe x-ray microanalysis of thin filmsThin Solid Films, 1983
- Quantitative electron probe microanalysis using Gaussian ϕ(ρz) CurvesX-Ray Spectrometry, 1982
- A Gaussian expression to describe ϕ(ρz) curves for quantitative electron probe microanalysisX-Ray Spectrometry, 1981