Reflection near-field scanning optical microscopy: an interferometric approach
- 31 December 1995
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 61 (1-4) , 233-236
- https://doi.org/10.1016/0304-3991(95)00115-8
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Scanning near-field optical microscopyApplied Physics A, 1994
- Phase contrast and amplitude pseudoheterodyne interference near field scanning optical microscopyApplied Physics Letters, 1993
- Near-Field Optics: Microscopy, Spectroscopy, and Surface Modification Beyond the Diffraction LimitScience, 1992
- Combined shear force and near-field scanning optical microscopyApplied Physics Letters, 1992