Amorphous and microcrystalline silicon bipolar heterojunction transistors

This publication has 2 references indexed in Scilit:

• An investigation of the thermal stability of the interfacial oxide in polycrystalline silicon emitter bipolar transistors by comparing device results with high-resolution electron microscopy observations
  Journal of Applied Physics, 1987
• The use of amorphous and microcrystalline silicon for silicon heterojunction bipolar transistors
  Applied Physics A, 1986