Atomic force microscopy study of titanium dioxide thin films grown by atomic layer epitaxy
- 1 May 1993
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 228 (1-2) , 32-35
- https://doi.org/10.1016/0040-6090(93)90557-6
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
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